Category: JEDEC

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 01/01/2014

POD135 – 1.35 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 03/01/2016

Low Power Double Data Rate 4 (LPDDR4)
standard by JEDEC Solid State Technology Association, 02/01/2017

NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 10/01/2012

CERAMIC PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES
standard by JEDEC Solid State Technology Association, 08/01/1993

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2011

MULTIMEDIACARD (MMC) ELECTRICAL STANDARD, STANDARD CAPACITY (MMCA, 4.1)
standard by JEDEC Solid State Technology Association, 06/01/2007

Solid-State Drive (SSD) Endurance Workloads
standard by JEDEC Solid State Technology Association, 07/01/2012

IPC/JEDEC-9703: Mechanical Shock Test Guidelines for Solder Joint Reliability
standard by JEDEC Solid State Technology Association, 03/01/2009