Category: JEDEC

EARLY LIFE FAILURE RATE CALCULATION PROCEDURE FOR SEMICONDUCTOR COMPONENTS
standard by JEDEC Solid State Technology Association, 02/01/2007

SERIAL INTERFACE FOR DATA CONVERTERS
standard by JEDEC Solid State Technology Association, 04/01/2008

INTEGRATED CIRCUITS THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – NATURAL CONVECTION (STILL AIR)
standard by JEDEC Solid State Technology Association, 01/01/2007

WIDE I/O 2 (WideIO2)
standard by JEDEC Solid State Technology Association, 08/01/2014

ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
standard by JEDEC Solid State Technology Association, 04/01/1995

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 02/01/2011

IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 09/01/2010

STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1996

ADDENDUM No. 5 to JESD12 – DESIGN FOR TESTABILITY GUIDELINES
Amendment by JEDEC Solid State Technology Association, 08/01/1988

UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION
standard by JEDEC Solid State Technology Association, 01/01/2018