Category: JEDEC

STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1996

ADDENDUM No. 5 to JESD12 – DESIGN FOR TESTABILITY GUIDELINES
Amendment by JEDEC Solid State Technology Association, 08/01/1988

UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION
standard by JEDEC Solid State Technology Association, 01/01/2018

DEFINITION OF THE SSTU32S869 & SSTU32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 04/01/2007

PROCESS FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
standard by JEDEC Solid State Technology Association, 05/01/2005

Addendum No. 1 to JESD251, Optional x4 Quad I/O With Data Strobe
Amendment by JEDEC Solid State Technology Association, 10/01/2018

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 11/01/2010

Universal Flash Storage (UFS) Host Controller Interface
standard by JEDEC Solid State Technology Association, 06/01/2012

ADDENDUM No. 1 to JESD35 – GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 09/01/1995

Component Quality Problem Analysis and Corrective Action Requirements (Including Administrative Quality Problems)
standard by JEDEC Solid State Technology Association, 07/01/2018