Category: JEDEC

STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATURE
standard by JEDEC Solid State Technology Association, 02/01/1998

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
standard by JEDEC Solid State Technology Association, 12/01/2018

Terms, Definitions, and Letter Symbols for Discrete Semiconductor and Optoelectronic Devices
standard by JEDEC Solid State Technology Association, 08/01/2012

BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 08/01/2018

Low Power Double Data Rate 4 (LPDDR4)
standard by JEDEC Solid State Technology Association, 2014

TRANSIENT VOLTAGE SUPPRESSOR STANDARD FOR THYRISTOR SURGE PROTECTIVE DEVICE
standard by JEDEC Solid State Technology Association, 11/01/1999

PACKAGE WARPAGE MEASUREMENT OF SURFACE-MOUNT INTEGRATED CIRCUITS AT ELEVATED TEMPERATURE
standard by JEDEC Solid State Technology Association, 10/01/2009

GUIDELINE FOR OBTAINING AND ACCEPTING MATERIAL FOR USE IN HYBRID / MCM PRODUCTS
standard by JEDEC Solid State Technology Association, 05/01/2002

POD135 – 1.35 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 09/01/2013

Descriptive Designation System for Semiconductor-device Packages
standard by JEDEC Solid State Technology Association, 01/01/2016