IEC 60747-10 Ed. 2.0 b:1991

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It is a generic specification for semiconductor devices, discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for measuring methods of electrical characteristics, climatic and mechanical tests, and endurance tests.

Product Details

Edition:
2.0
Published:
05/21/1991
Number of Pages:
86
File Size:
1 file , 3.9 MB